Detail publikačního výsledku

Nanometric applications of the Scanning Near-field optical microscopy

TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D., UHDEOVÁ, N.

Originální název

Nanometric applications of the Scanning Near-field optical microscopy

Anglický název

Nanometric applications of the Scanning Near-field optical microscopy

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Scanning near-field optical microscopy (SNOM or NSOM) involves the potential and technology of scanning probe microscopes and performance of optical microscopes. SNOM combines the excellent spectral and temporal resolution of classical microscopes with spatial resolution better than 100 nm. In this paper the review of basic principles of aperture SNOM and some of its applications are desribed.

Anglický abstrakt

Scanning near-field optical microscopy (SNOM or NSOM) involves the potential and technology of scanning probe microscopes and performance of optical microscopes. SNOM combines the excellent spectral and temporal resolution of classical microscopes with spatial resolution better than 100 nm. In this paper the review of basic principles of aperture SNOM and some of its applications are desribed.

Klíčová slova

nanometrology, SNOM, spatial resolution, contrast, magnetic imaging, nanolitography, data storage, quantum structures, photonics

Klíčová slova v angličtině

nanometrology, SNOM, spatial resolution, contrast, magnetic imaging, nanolitography, data storage, quantum structures, photonics

Autoři

TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D., UHDEOVÁ, N.

Vydáno

12.01.2003

Nakladatel

Česká společnost pro nové materiály a technologie

Místo

Brno

ISBN

80-7329-027-8

Kniha

Proceedings of the National Conference NANO´02

Strany od

166

Strany počet

4

BibTex

@inproceedings{BUT7358,
  author="Pavel {Tománek} and Pavel {Dobis} and Markéta {Benešová} and Dana {Otevřelová} and Naděžda {Uhdeová}",
  title="Nanometric applications of the Scanning Near-field optical microscopy",
  booktitle="Proceedings of the National Conference NANO´02",
  year="2003",
  pages="4",
  publisher="Česká společnost pro nové materiály a technologie",
  address="Brno",
  isbn="80-7329-027-8"
}