Detail publikačního výsledku

Development of the program EOD for design in electron and ion microscopy

ZLÁMAL, J.; LENCOVÁ, B.

Originální název

Development of the program EOD for design in electron and ion microscopy

Anglický název

Development of the program EOD for design in electron and ion microscopy

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

Anglický abstrakt

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

Klíčová slova

Finite elementmethod; Tolerancing; User interface

Klíčová slova v angličtině

Finite elementmethod; Tolerancing; User interface

Autoři

ZLÁMAL, J.; LENCOVÁ, B.

Rok RIV

2012

Vydáno

21.07.2011

ISSN

0168-9002

Periodikum

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Svazek

645

Číslo

1

Stát

Nizozemsko

Strany od

278

Strany do

282

Strany počet

5

BibTex

@article{BUT72696,
  author="Jakub {Zlámal} and Bohumila {Lencová}",
  title="Development of the program EOD for design in electron and ion microscopy",
  journal="NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT",
  year="2011",
  volume="645",
  number="1",
  pages="278--282",
  issn="0168-9002"
}