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Detail publikačního výsledku
BENEŠOVÁ, M., LIŠKA, M.
Originální název
Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
Recently, various versions of Scanning Near-Field Optical Microscopes (SNOM) have been developed, pushing the limits of lateral resolution beyond the Rayleigh criterion: the value of /30 instead /2 have been reached. Unfortunately, images obtained by SNOM depend strongly on the experimental conditions (angle of incidence, polarization, incidence plane direction, sample nature,…). Theoretical studies are thus necessary for interpreting experimental data. Here, we present a model of complex samples (multilayers) and to the general tip geometry. Moreover, this model can be used for various SNOM configurations and to take the sample-electromagnetic coupling into account.
Anglický abstrakt
Klíčová slova
scanning near-field optical microscopy, probe, sample, coating, resolution
Klíčová slova v angličtině
Autoři
Vydáno
19.10.2000
Nakladatel
STU Bratislava
Místo
Trnava
ISBN
80-227-1413-5
Kniha
CO-MAT-TECH 2000
Edice
svazek 4
Strany od
85
Strany počet
6
BibTex
@inproceedings{BUT7036, author="Markéta {Benešová} and Miroslav {Liška}", title="Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy", booktitle="CO-MAT-TECH 2000", year="2000", series="svazek 4", pages="6", publisher="STU Bratislava", address="Trnava", isbn="80-227-1413-5" }