Detail publikačního výsledku

Application of TOF - LEIS and XPS for Surface Studies.

PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J.

Originální název

Application of TOF - LEIS and XPS for Surface Studies.

Anglický název

Application of TOF - LEIS and XPS for Surface Studies.

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.

Anglický abstrakt

In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.

Klíčová slova v angličtině

SIMS, TOF

Autoři

PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J.

Rok RIV

2011

Vydáno

27.06.2001

Nakladatel

Vutium

Místo

Brno

ISBN

80-214-1892-3

Kniha

Materials Structure & Micromechanics of Fracture (MSMF-3)

Strany od

486

Strany počet

8

BibTex

@inproceedings{BUT6287,
  author="Stanislav {Průša} and Tomáš {Šikola} and Jiří {Spousta} and Stanislav {Voborný} and Petr {Bábor} and Patrik {Jurkovič} and Jan {Čechal}",
  title="Application of TOF - LEIS and XPS for Surface Studies.",
  booktitle="Materials Structure & Micromechanics of Fracture (MSMF-3)",
  year="2001",
  pages="8",
  publisher="Vutium",
  address="Brno",
  isbn="80-214-1892-3"
}