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RŮŽIČKA, B., WILFERT, O.
Originální název
Measurement of Residual Reflectivity and Wavelength of Coated Laser Diodes
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
This contribution presents experimental results obtained by deposition of double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4.
Anglický abstrakt
Klíčová slova v angličtině
laser diode, antireflection coating, ECL
Autoři
Vydáno
10.05.2001
Nakladatel
Institute of Radio Electronics, Brno UT
ISBN
80-214-1861-3
Kniha
RADIOELEKTRONIKA 2001
Strany od
286
Strany počet
4
BibTex
@inproceedings{BUT6277, author="Bohdan {Růžička} and Otakar {Wilfert}", title="Measurement of Residual Reflectivity and Wavelength of Coated Laser Diodes", booktitle="RADIOELEKTRONIKA 2001", year="2001", pages="4", publisher="Institute of Radio Electronics, Brno UT", isbn="80-214-1861-3" }