Detail publikačního výsledku

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

VANĚK, J., CHOBOLA, Z., BAŘINKA, R.

Originální název

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Analyze of new production technology of photovoltaic cells contact by using I-V characteristic and noise spectroscopy.

Anglický abstrakt

Analyze of new production technology of photovoltaic cells contact by using I-V characteristic and noise spectroscopy.

Klíčová slova v angličtině

Noise, contact, spectroscopy

Autoři

VANĚK, J., CHOBOLA, Z., BAŘINKA, R.

Vydáno

17.09.2002

Místo

Prague

ISBN

80-01-02579-9

Kniha

Physical and Material Engineering 2002

Strany od

121

Strany počet

2

BibTex

@inproceedings{BUT5020,
  author="Jiří {Vaněk} and Radim {Bařinka} and Zdeněk {Chobola}",
  title="Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools",
  booktitle="Physical and Material Engineering 2002",
  year="2002",
  pages="2",
  address="Prague",
  isbn="80-01-02579-9"
}