Detail publikace

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

VANĚK, J., CHOBOLA, Z., BAŘINKA, R.

Originální název

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Český název

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

cs

Originální abstrakt

Analyze of new production technology of photovoltaic cells contact by using I-V characteristic and noise spectroscopy.

Český abstrakt

Analyze of new production technology of photovoltaic cells contact by using I-V characteristic and noise spectroscopy.

Vydáno

17.09.2002

Místo

Prague

ISBN

80-01-02579-9

Kniha

Physical and Material Engineering 2002

Strany od

121

Strany do

122

Strany počet

2

Dokumenty

BibTex 


@inproceedings{BUT5020,
  author="Jiří {Vaněk} and Radim {Bařinka} and Zdeněk {Chobola}",
  title="Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools",
  annote="Analyze of new production technology of photovoltaic cells contact by using I-V characteristic and noise spectroscopy.",
  booktitle="Physical and Material Engineering 2002",
  chapter="5020",
  year="2002",
  month="september",
  pages="121",
  type="conference paper"
}