Detail publikačního výsledku

Charge carrier transport and noise of niobium capacitors

ŠIKULA, J., PAVELKA, J., DOBIS, P., ZEDNÍČEK, T.

Originální název

Charge carrier transport and noise of niobium capacitors

Anglický název

Charge carrier transport and noise of niobium capacitors

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can be used to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences.

Anglický abstrakt

A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can be used to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences.

Klíčová slova v angličtině

Noise, niobium capacitor, spectral density

Autoři

ŠIKULA, J., PAVELKA, J., DOBIS, P., ZEDNÍČEK, T.

Vydáno

20.10.2002

Nakladatel

Electronic Components Institute Internationale, Ltd.

Místo

SWINDON, England

Kniha

Proceeding of CARTS 2002 - 16th European Passive Components Conference

Strany od

32

Strany počet

5

BibTex

@inproceedings{BUT4821,
  author="Josef {Šikula} and Jan {Pavelka} and Pavel {Dobis} and Tomáš {Zedníček}",
  title="Charge carrier transport and noise of niobium capacitors",
  booktitle="Proceeding of CARTS 2002 - 16th European Passive Components Conference",
  year="2002",
  pages="5",
  publisher="Electronic Components Institute Internationale, Ltd.",
  address="SWINDON, England"
}