Detail publikace

Stress Testing in the Evaluation the Reliability of Electronic Devices

NOVOTNÝ, R.

Originální název

Stress Testing in the Evaluation the Reliability of Electronic Devices

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.

Klíčová slova

reliability, environmental tests, hazard rate model, burn-in

Autoři

NOVOTNÝ, R.

Rok RIV

2001

Vydáno

1. 1. 2001

Nakladatel

Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105

Místo

Crete 2001

ISBN

80-214-2027-8

Kniha

Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings

Číslo edice

1

Strany od

253

Strany do

257

Strany počet

5

BibTex

@inproceedings{BUT3858,
  author="Radovan {Novotný}",
  title="Stress Testing in the Evaluation the Reliability of Electronic Devices",
  booktitle="Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings",
  year="2001",
  number="1",
  pages="5",
  publisher="Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105",
  address="Crete 2001",
  isbn="80-214-2027-8"
}