Detail publikačního výsledku

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

IBRAHIM, A., ŠIKULA, J., CHOBOLA, Z.

Originální název

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

Anglický název

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Both non-linearity measurements by Third Harmonic Index (THI) and Low Frequency Noise (LFN) techniques being taking as a measure of the reliability for a semiconductor device such as silicon solar cell.

Anglický abstrakt

Both non-linearity measurements by Third Harmonic Index (THI) and Low Frequency Noise (LFN) techniques being taking as a measure of the reliability for a semiconductor device such as silicon solar cell.

Klíčová slova v angličtině

Noise, quality, silicon solar cells

Autoři

IBRAHIM, A., ŠIKULA, J., CHOBOLA, Z.

Vydáno

22.10.2001

Nakladatel

University of Florida

Místo

Gainesville, Florida, USA

Kniha

Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001

Strany od

739

Strany počet

4

BibTex

@inproceedings{BUT3720,
  author="Ali {Ibrahim} and Josef {Šikula} and Zdeněk {Chobola}",
  title="Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells",
  booktitle="Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001",
  year="2001",
  pages="4",
  publisher="University of Florida",
  address="Gainesville, Florida, USA"
}