Detail publikace

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

IBRAHIM, A., ŠIKULA, J., CHOBOLA, Z.

Originální název

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

Anglický název

Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells

Jazyk

en

Originální abstrakt

Both non-linearity measurements by Third Harmonic Index (THI) and Low Frequency Noise (LFN) techniques being taking as a measure of the reliability for a semiconductor device such as silicon solar cell.

Anglický abstrakt

Both non-linearity measurements by Third Harmonic Index (THI) and Low Frequency Noise (LFN) techniques being taking as a measure of the reliability for a semiconductor device such as silicon solar cell.

Dokumenty

BibTex 


@inproceedings{BUT3720,
  author="Ali {Ibrahim} and Josef {Šikula} and Zdeněk {Chobola}",
  title="Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells",
  annote="Both non-linearity measurements by Third Harmonic Index (THI) and Low Frequency Noise (LFN) techniques being taking as a measure of the reliability for a semiconductor device such as silicon solar cell.",
  address="University of Florida",
  booktitle="Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001",
  chapter="3720",
  institution="University of Florida",
  year="2001",
  month="october",
  pages="739",
  publisher="University of Florida",
  type="conference paper"
}