Detail publikace

Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools

CHOBOLA, Z. IBRAHIM, A. RŮŽIČKA, Z.

Originální název

Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools

Anglický název

Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools

Jazyk

en

Originální abstrakt

The technique of Light Beam Induced Voltage LBIV, low frequency noise vs frequency are shown to be a powerful diagnostic technique for determining homogeneity of the doping concentration and Generation Recombination (G.R.) trapping parameters in Si solar cells.

Anglický abstrakt

The technique of Light Beam Induced Voltage LBIV, low frequency noise vs frequency are shown to be a powerful diagnostic technique for determining homogeneity of the doping concentration and Generation Recombination (G.R.) trapping parameters in Si solar cells.

Dokumenty

BibTex 


@inproceedings{BUT3494,
  author="Zdeněk {Chobola} and Ali {Ibrahim} and Zbyněk {Růžička}",
  title="Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools",
  annote="The technique of Light Beam Induced Voltage LBIV, low frequency noise vs frequency are shown to be a powerful diagnostic technique for determining homogeneity of the doping concentration and Generation Recombination (G.R.) trapping parameters in Si solar cells.",
  address="The Slovenian Society for Non-destructive Testing",
  booktitle="The 6th International Conference of the Slovenian Society for Non-destructive Testing",
  chapter="3494",
  institution="The Slovenian Society for Non-destructive Testing",
  year="2001",
  month="september",
  pages="355",
  publisher="The Slovenian Society for Non-destructive Testing",
  type="conference paper"
}