Detail publikačního výsledku

Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools

CHOBOLA, Z.; IBRAHIM, A.; RŮŽIČKA, Z.

Originální název

Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools

Anglický název

Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The technique of Light Beam Induced Voltage LBIV, low frequency noise vs frequency are shown to be a powerful diagnostic technique for determining homogeneity of the doping concentration and Generation Recombination (G.R.) trapping parameters in Si solar cells.

Anglický abstrakt

The technique of Light Beam Induced Voltage LBIV, low frequency noise vs frequency are shown to be a powerful diagnostic technique for determining homogeneity of the doping concentration and Generation Recombination (G.R.) trapping parameters in Si solar cells.

Klíčová slova v angličtině

LBIV, noise spectroscopy, DLTS, silicon solar cell

Autoři

CHOBOLA, Z.; IBRAHIM, A.; RŮŽIČKA, Z.

Vydáno

13.09.2001

Nakladatel

The Slovenian Society for Non-destructive Testing

Místo

Portorož

ISBN

961-90610-1-2

Kniha

The 6th International Conference of the Slovenian Society for Non-destructive Testing

Strany od

355

Strany počet

7

BibTex

@inproceedings{BUT3494,
  author="Zdeněk {Chobola} and Ali {Ibrahim} and Zbyněk {Růžička}",
  title="Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools",
  booktitle="The 6th International Conference of the Slovenian Society for Non-destructive Testing",
  year="2001",
  pages="7",
  publisher="The Slovenian Society for Non-destructive Testing",
  address="Portorož",
  isbn="961-90610-1-2"
}