Detail publikačního výsledku

Scintillationsecondary electron detector for variable pressure scanning electron microscope

ČUDEK, P.

Originální název

Scintillationsecondary electron detector for variable pressure scanning electron microscope

Anglický název

Scintillationsecondary electron detector for variable pressure scanning electron microscope

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This article deals with a scintillation detector of secondary electrons for variable pressure scanning electron microscope. The influence of the change of voltages on electrode system of the detector and on scintillator on secondary electrons detection is proved

Anglický abstrakt

This article deals with a scintillation detector of secondary electrons for variable pressure scanning electron microscope. The influence of the change of voltages on electrode system of the detector and on scintillator on secondary electrons detection is proved

Klíčová slova

Scanning electron microscope (SEM), variable pressure scanning electron microscope (VPSEM), scintillation detector (SD), secondary electrons (SE).

Klíčová slova v angličtině

Scanning electron microscope (SEM), variable pressure scanning electron microscope (VPSEM), scintillation detector (SD), secondary electrons (SE).

Autoři

ČUDEK, P.

Rok RIV

2010

Vydáno

23.04.2009

Nakladatel

Novpress s.r.o

Místo

Brno

ISBN

978-80-214-3869-9

Kniha

Proceedings of the 15th conference Student EEICT 2009 - Volume 3

Strany od

187

Strany do

191

Strany počet

4

URL

http://www.feec.vutbr.cz/EEICT/

BibTex

@inproceedings{BUT29978,
  author="Pavel {Čudek}",
  title="Scintillationsecondary electron detector for variable pressure scanning electron microscope",
  booktitle="Proceedings of the 15th conference Student EEICT 2009 - Volume 3",
  year="2009",
  number="1",
  pages="187--191",
  publisher="Novpress s.r.o",
  address="Brno",
  isbn="978-80-214-3869-9",
  url="http://www.feec.vutbr.cz/EEICT/"
}