Detail publikačního výsledku

Passivation quality test by noise method

VANĚK, J.; KAZELLE, J.; CHOBOLA, Z.; JURÁNKOVÁ, V.

Originální název

Passivation quality test by noise method

Anglický název

Passivation quality test by noise method

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Transport and noise characteristic of forward biased monocrystalline silicon solar cells made by different passivation method were measured in order to evaluate new technology:

Anglický abstrakt

Transport and noise characteristic of forward biased monocrystalline silicon solar cells made by different passivation method were measured in order to evaluate new technology:

Klíčová slova

noise characteristic

Klíčová slova v angličtině

noise characteristic

Autoři

VANĚK, J.; KAZELLE, J.; CHOBOLA, Z.; JURÁNKOVÁ, V.

Vydáno

14.09.2006

Nakladatel

Ing.Zdeněk Novotný,CSc.

Místo

Brno

ISBN

80-214-3246-2

Kniha

Electronic Devices and Systems

Strany od

175

Strany do

178

Strany počet

4

BibTex

@inproceedings{BUT25071,
  author="Jiří {Vaněk} and Jiří {Kazelle} and Zdeněk {Chobola} and Vlasta {Juránková}",
  title="Passivation quality test by noise method",
  booktitle="Electronic Devices and Systems",
  year="2006",
  pages="175--178",
  publisher="Ing.Zdeněk Novotný,CSc.",
  address="Brno",
  isbn="80-214-3246-2"
}