Detail publikačního výsledku

Detection of the True Secondary Electrons with a Newly Designed Ionization Detector for ESEM.

Neděla V., Linhart H., Autrata R.

Originální název

Detection of the True Secondary Electrons with a Newly Designed Ionization Detector for ESEM.

Anglický název

Detection of the True Secondary Electrons with a Newly Designed Ionization Detector for ESEM.

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The detection of pure secondary electrons (SE) with energy lower than 50eV, typically 5eV, by suppressing the backscattered electrons (BSE) minimizes the influence of material information in recorded picture and enables the study of topographical structure of the specimen with high resolution.

Anglický abstrakt

The detection of pure secondary electrons (SE) with energy lower than 50eV, typically 5eV, by suppressing the backscattered electrons (BSE) minimizes the influence of material information in recorded picture and enables the study of topographical structure of the specimen with high resolution.

Klíčová slova

SE,BSE,detection system

Klíčová slova v angličtině

SE,BSE,detection system

Autoři

Neděla V., Linhart H., Autrata R.

Vydáno

01.01.2006

Místo

Sapporo

Kniha

16th International Microscopy Congress

Strany od

982

Strany počet

2

BibTex

@inproceedings{BUT24787,
  author="Vilém {Neděla} and Jan {Linhart}",
  title="Detection of the True Secondary Electrons with a Newly Designed Ionization Detector for ESEM.",
  booktitle="16th International Microscopy Congress",
  year="2006",
  pages="2",
  address="Sapporo"
}