Detail publikačního výsledku

A Complex Approach to Digital RTL Circuit Testability - iFCoRT System

RŮŽIČKA, R.

Originální název

A Complex Approach to Digital RTL Circuit Testability - iFCoRT System

Anglický název

A Complex Approach to Digital RTL Circuit Testability - iFCoRT System

Druh

Stať ve sborníku mimo WoS a Scopus

Originální abstrakt

In the paper, a complex approach to the RT level digital circuit diagnostics is presented. This system we call iFCoRT - I path Based, Formally Described and Proved Concept of RTL Digital Circuits Testability. The approach is based on the I path concept and employs Design-for-Testability principles such as Partial Scan etc. Presented approach includes the model of the circuit, testability analysis, testability verification, test scheduling and test controller synthesis. All modules of the system are formally specified and then are, step-by-step, formally proved their correctness.

Anglický abstrakt

In the paper, a complex approach to the RT level digital circuit diagnostics is presented. This system we call iFCoRT - I path Based, Formally Described and Proved Concept of RTL Digital Circuits Testability. The approach is based on the I path concept and employs Design-for-Testability principles such as Partial Scan etc. Presented approach includes the model of the circuit, testability analysis, testability verification, test scheduling and test controller synthesis. All modules of the system are formally specified and then are, step-by-step, formally proved their correctness.

Klíčová slova

RT level diagnostics, i paths, design-for-testability

Klíčová slova v angličtině

RT level diagnostics, i paths, design-for-testability

Autoři

RŮŽIČKA, R.

Vydáno

23.05.2005

Nakladatel

Tallinn University of Technology

Místo

Tallinn

Kniha

Informal Digest of Papers of the IEEE European Test Symposium 2005

Strany od

156

Strany do

157

Strany počet

2

BibTex

@inproceedings{BUT21509,
  author="Richard {Růžička}",
  title="A Complex Approach to Digital RTL Circuit Testability - iFCoRT System",
  booktitle="Informal Digest of Papers of the IEEE European Test Symposium 2005",
  year="2005",
  pages="156--157",
  publisher="Tallinn University of Technology",
  address="Tallinn"
}