Detail publikačního výsledku

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

BENEŠOVÁ, M., TOMÁNEK, P., LIŠKA, M.

Originální název

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

Anglický název

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Images obtained in Scanning near-field optical microscopy (SNOM) depend strongly on the experimental conditions. The theoretical model taking into account a complex structure of samples (multilayers) and a general tip geometry is introduced. This model can be applied to the different SNOM configurations and for various sampéle-electromagnetic coupling factors.

Anglický abstrakt

Images obtained in Scanning near-field optical microscopy (SNOM) depend strongly on the experimental conditions. The theoretical model taking into account a complex structure of samples (multilayers) and a general tip geometry is introduced. This model can be applied to the different SNOM configurations and for various sampéle-electromagnetic coupling factors.

Klíčová slova

resolution, sample coating, local probe, scanning near field optical microscopy

Klíčová slova v angličtině

resolution, sample coating, local probe, scanning near field optical microscopy

Autoři

BENEŠOVÁ, M., TOMÁNEK, P., LIŠKA, M.

Vydáno

19.10.2000

Nakladatel

Slovenská technická univerzita v Bratislave

Místo

Bratislava

ISBN

80-227-1413-5

Kniha

CO-MAT-TECH 2000, 8. Medzinárodná vedecká konferencia, sv.4

Strany od

85 - 90

Strany počet

6