Detail publikace

Low-frequency Noise Measurements used for semiconductors light active devices

VANĚK, J. CHOBOLA, Z.

Originální název

Low-frequency Noise Measurements used for semiconductors light active devices

Anglický název

Low-frequency Noise Measurements used for semiconductors light active devices

Jazyk

en

Originální abstrakt

Three different sets of semiconductors light active devices were by low frequency noise diagnostic described.

Anglický abstrakt

Three different sets of semiconductors light active devices were by low frequency noise diagnostic described.

Dokumenty

BibTex 


@inproceedings{BUT21250,
  author="Jiří {Vaněk} and Zdeněk {Chobola}",
  title="Low-frequency Noise Measurements used for semiconductors light active devices",
  annote="Three different sets of semiconductors light active devices were by low frequency noise diagnostic described.",
  booktitle="Noise in Devices",
  chapter="21250",
  year="2005",
  month="may",
  pages="86--93",
  type="conference paper"
}