Structural and electrical characterization of cadmium phosphate glasses doped with different concentration of sodium chloride

Structural and electrical characterization of cadmium phosphate glasses doped with different concentration of sodium chloride

Článek WoS

The electrical characteristics of cadmium phosphate glasses doped with varying concentrations of sodium chloride [ Cd-3( PO4)(2)](1-x) [ NaCl](x) , where x = 0, 2, 4 ,6 mol.% NaCl, were investigated with respect to both dopant levels and temperature. Electrical impedance spectroscopy was employed, and impedance measurements were taken across the frequency spectrum from 10(2) Hz to 10(6) Hz. Samples were characterized by scanning electron microscopy-energy dispersive x-ray spectroscopy, x-ray diffraction analysis and Fourier Transform Infrared Spectroscopy. The fi ndings revealed a decrease in bulk resistance with increasing temperature and dopant concentration, indicating a rise in DC- conductivity and suggesting a semiconducting behavior in the material. Moreover, the activation energy values were noted to decrease as dopant concentration increased. Analysis of the AC-conductivity variation with frequency delineated two distinct regions: a low-frequency region where AC-conductivity increased with frequency, indicative of a "pumping force" effect aiding charge carrier movement through various conduction states, and a high-frequency region or frequency-independent zone signifying a transition towards a more ohmic behavior in the material. The study highlighted a decrease in both the dielectric constant and dielectric loss with rising temperature and frequency across all dopant concentrations. Furthermore, the Reaction Coefficient "s" was found to be less than one, suggesting that the conduction mechanism can be elucidated in terms of the Correlated Barrier Hopping ( CBH ) model.

The electrical characteristics of cadmium phosphate glasses doped with varying concentrations of sodium chloride [ Cd-3( PO4)(2)](1-x) [ NaCl](x) , where x = 0, 2, 4 ,6 mol.% NaCl, were investigated with respect to both dopant levels and temperature. Electrical impedance spectroscopy was employed, and impedance measurements were taken across the frequency spectrum from 10(2) Hz to 10(6) Hz. Samples were characterized by scanning electron microscopy-energy dispersive x-ray spectroscopy, x-ray diffraction analysis and Fourier Transform Infrared Spectroscopy. The fi ndings revealed a decrease in bulk resistance with increasing temperature and dopant concentration, indicating a rise in DC- conductivity and suggesting a semiconducting behavior in the material. Moreover, the activation energy values were noted to decrease as dopant concentration increased. Analysis of the AC-conductivity variation with frequency delineated two distinct regions: a low-frequency region where AC-conductivity increased with frequency, indicative of a "pumping force" effect aiding charge carrier movement through various conduction states, and a high-frequency region or frequency-independent zone signifying a transition towards a more ohmic behavior in the material. The study highlighted a decrease in both the dielectric constant and dielectric loss with rising temperature and frequency across all dopant concentrations. Furthermore, the Reaction Coefficient "s" was found to be less than one, suggesting that the conduction mechanism can be elucidated in terms of the Correlated Barrier Hopping ( CBH ) model.

impedance spectroscopy; electrical conductivity; DC-conductivity; Jonscher's power law; activation energy; dielectric constant; dielectric loss

impedance spectroscopy; electrical conductivity; DC-conductivity; Jonscher's power law; activation energy; dielectric constant; dielectric loss

ASSAYED, G.; SHAHEEN, A.; ALSOUD, A.; AL-BASHAISH, S.; MOUSA, M.; KNÁPEK, A.; SOBOLA, D.

2025

01.12.2024

IOP Publishing

BRISTOL

1402-4896

Physica Scripta

99

12

Spojené království Velké Británie a Severního Irska

1

14

14

https://iopscience.iop.org/article/10.1088/1402-4896/ad8822

http://hdl.handle.net/11012/251915

Assayed_2024_Phys._Scr._99_125018