Detail publikačního výsledku

An enhanced theoretical approach for accurate measurements of the optical and energy characteristics of semiconducting materials

ALLAHAM, M.; KOŠELOVÁ, Z.; SOBOLA, D.; FOHLEROVÁ, Z.; KNÁPEK, A.

Originální název

An enhanced theoretical approach for accurate measurements of the optical and energy characteristics of semiconducting materials

Anglický název

An enhanced theoretical approach for accurate measurements of the optical and energy characteristics of semiconducting materials

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The absorption coefficient is an important optical property in characterizing semiconducting materials. It plays a significant role in studying optical characteristics, electrical structure, energy band structure, and the creation/annihilation of excitons when a semiconducting material absorbs electromagnetic radiation. In this study, an enhanced theoretical model will be introduced and applied to characterize thin films prepared from UPR4 (unsaturated polyester resin) single-component epoxy resin, which is important to study the charge flow at the interface of tungsten-UPR4 composite field emission cathodes

Anglický abstrakt

The absorption coefficient is an important optical property in characterizing semiconducting materials. It plays a significant role in studying optical characteristics, electrical structure, energy band structure, and the creation/annihilation of excitons when a semiconducting material absorbs electromagnetic radiation. In this study, an enhanced theoretical model will be introduced and applied to characterize thin films prepared from UPR4 (unsaturated polyester resin) single-component epoxy resin, which is important to study the charge flow at the interface of tungsten-UPR4 composite field emission cathodes

Klíčová slova

absorption coefficient, energy gap, Urbach tailing energy, Tauc plot, transmittance, and reflectance.

Klíčová slova v angličtině

absorption coefficient, energy gap, Urbach tailing energy, Tauc plot, transmittance, and reflectance.

Autoři

ALLAHAM, M.; KOŠELOVÁ, Z.; SOBOLA, D.; FOHLEROVÁ, Z.; KNÁPEK, A.

Rok RIV

2025

Vydáno

23.04.2024

Nakladatel

Brno University of Technology, Faculty of Electronic Engineering and Communication

Místo

Brno

ISBN

978-80-214-6230-4

Kniha

Proceedings II of the 30th Conference STUDENT EEICT 2024: Selected papers

Edice

1

Strany od

182

Strany do

186

Strany počet

5

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2024_sbornik_2.pdf

BibTex

@inproceedings{BUT193840,
  author="Mohammad Mahmoud Mohammad {Allaham} and Zuzana {Košelová} and Dinara {Sobola} and Zdenka {Fohlerová} and Alexandr {Knápek}",
  title="An enhanced theoretical approach for accurate measurements of the optical and energy characteristics of semiconducting materials",
  booktitle="Proceedings II of the 30th Conference STUDENT EEICT 2024: Selected papers",
  year="2024",
  series="1",
  pages="182--186",
  publisher="Brno University of Technology, Faculty of Electronic Engineering and Communication",
  address="Brno",
  doi="10.13164/eeict.2024.182",
  isbn="978-80-214-6230-4",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2024_sbornik_2.pdf"
}