Detail publikačního výsledku

Characterization of field emission from oxidized copper emitters

Abuamr, AM.; Mousa, MS.; Al-Bashaish, SR.; Madanat, MA.; AlSoud, A.; Jaber, AMD.; Alqaisi, AF.; Al-Anber, MA.; Barzinjy, AA.; Arrasheed, EA.; Sobola, D,

Originální název

Characterization of field emission from oxidized copper emitters

Anglický název

Characterization of field emission from oxidized copper emitters

Druh

Článek WoS

Originální abstrakt

In this work, the field electron emission from oxidized copper emitters was studied by aging with radii in the range of 80-300 nm. The samples were prepared by an electrochemical etching method using an H3PO4 solution. The samples were exposed to air for 30 d to form an oxide film owing to aging. Measurements were carried out under high vacuum conditions in the range of 10-6 mbar. Scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM- EDS) was used to calculate the emitter radius, study the purity of the samples, and detect the oxide layers. Current-voltage (I-V) characteristics were studied and analyzed using Murphy-Goode (MG) plots and rectification tests. Furthermore, the spatial distribution of the electron emission and current stability were recorded and used to analyze the electron emission behavior of the tip surface. The trap density was also studied when the oxide layer was 3 layers thick. The results show that the emitters passed the orthodoxy test at low voltages. It was found that traps play an important role in increasing the switch-on current as the area of the oxide layer increases. It was found that the emitter acts as a point capacitor based on the charging and discharging processes of the electrons in the traps. The emission pattern showed great stability, which opens up prospects for this type of emitter in industry.

Anglický abstrakt

In this work, the field electron emission from oxidized copper emitters was studied by aging with radii in the range of 80-300 nm. The samples were prepared by an electrochemical etching method using an H3PO4 solution. The samples were exposed to air for 30 d to form an oxide film owing to aging. Measurements were carried out under high vacuum conditions in the range of 10-6 mbar. Scanning electron microscopy-energy dispersive X-ray spectroscopy (SEM- EDS) was used to calculate the emitter radius, study the purity of the samples, and detect the oxide layers. Current-voltage (I-V) characteristics were studied and analyzed using Murphy-Goode (MG) plots and rectification tests. Furthermore, the spatial distribution of the electron emission and current stability were recorded and used to analyze the electron emission behavior of the tip surface. The trap density was also studied when the oxide layer was 3 layers thick. The results show that the emitters passed the orthodoxy test at low voltages. It was found that traps play an important role in increasing the switch-on current as the area of the oxide layer increases. It was found that the emitter acts as a point capacitor based on the charging and discharging processes of the electrons in the traps. The emission pattern showed great stability, which opens up prospects for this type of emitter in industry.

Klíčová slova

field electron emission; current-voltage characteristics; copper tips; high vacuum

Klíčová slova v angličtině

field electron emission; current-voltage characteristics; copper tips; high vacuum

Autoři

Abuamr, AM.; Mousa, MS.; Al-Bashaish, SR.; Madanat, MA.; AlSoud, A.; Jaber, AMD.; Alqaisi, AF.; Al-Anber, MA.; Barzinjy, AA.; Arrasheed, EA.; Sobola, D,

Rok RIV

2025

Vydáno

01.10.2024

Nakladatel

IOP Publishing Ltd

Místo

BRISTOL

ISSN

1402-4896

Periodikum

Physica Scripta

Svazek

99

Číslo

10

Stát

Spojené království Velké Británie a Severního Irska

Strany počet

14

URL

https://iopscience.iop.org/article/10.1088/1402-4896/ad7232

BibTex

@article{BUT189671,
  author="Abuamr, AM. and Mousa, MS. and Al-Bashaish, SR. and Madanat, MA. and AlSoud, A. and Jaber, AMD. and Alqaisi, AF. and Al-Anber, MA. and Barzinjy, AA. and Arrasheed, EA. and Sobola, D,",
  title="Characterization of field emission from oxidized copper emitters",
  journal="Physica Scripta",
  year="2024",
  volume="99",
  number="10",
  pages="14",
  doi="10.1088/1402-4896/ad7232",
  issn="0031-8949",
  url="https://iopscience.iop.org/article/10.1088/1402-4896/ad7232"
}