Detail publikačního výsledku

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Pinder, JW.; Major, GH.; Baer, DR.; Terry, J.; Whitten, JE.; Cechal, J.; Crossman, JD.; Lizarbe, AJ.; Jafari, S.; Easton, CD.; Baltrusaitis, J.; van Spronsen, MA.; Linford, MR.

Originální název

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Anglický název

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Druh

Článek WoS

Originální abstrakt

Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.

Anglický abstrakt

Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.

Klíčová slova

X-ray photoelectron spectroscopy; XPS; Reporting; Data collection; Common errors

Klíčová slova v angličtině

X-ray photoelectron spectroscopy; XPS; Reporting; Data collection; Common errors

Autoři

Pinder, JW.; Major, GH.; Baer, DR.; Terry, J.; Whitten, JE.; Cechal, J.; Crossman, JD.; Lizarbe, AJ.; Jafari, S.; Easton, CD.; Baltrusaitis, J.; van Spronsen, MA.; Linford, MR.

Rok RIV

2025

Vydáno

01.02.2024

Nakladatel

ELSEVIER

Místo

AMSTERDAM

ISSN

2666-5239

Periodikum

Applied Surface Science Advances

Svazek

19

Číslo

100534

Stát

Nizozemsko

Strany počet

29

URL

https://www.sciencedirect.com/science/article/pii/S266652392300168X?via%3Dihub

BibTex

@article{BUT188960,
  author="Pinder, JW. and Major, GH. and Baer, DR. and Terry, J. and Whitten, JE. and Cechal, J. and Crossman, JD. and Lizarbe, AJ. and Jafari, S. and Easton, CD. and Baltrusaitis, J. and van Spronsen, MA. and Linford, MR.",
  title="Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters",
  journal="Applied Surface Science Advances",
  year="2024",
  volume="19",
  number="100534",
  pages="29",
  doi="10.1016/j.apsadv.2023.100534",
  issn="2666-5239",
  url="https://www.sciencedirect.com/science/article/pii/S266652392300168X?via%3Dihub"
}