Detail publikačního výsledku

Scanning Probe Microscopy controller with advanced sampling support

VALTR, M.; KLAPETEK, P.; MARTINEK, J.; NOVOTNY, O.; JELINEK, Z.; HORTVÍK, V.; NEČAS, D.

Originální název

Scanning Probe Microscopy controller with advanced sampling support

Anglický název

Scanning Probe Microscopy controller with advanced sampling support

Druh

Článek WoS

Originální abstrakt

A low-cost Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements is presented. It is based on Red Pitaya board and custom built electronic boards with additional high bit depth AD and DA converters. By providing all the necessary information (position and time) with each data point collected it can be used for any scan path, using either existing libraries for scan path generation or creating adaptive scan paths using Lua scripting interface. The DSP is also capable of performing statistical calculations, that can be used for decision making during scan or for the scan path optimisation on the DSP level.& COPY; 2023 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).

Anglický abstrakt

A low-cost Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements is presented. It is based on Red Pitaya board and custom built electronic boards with additional high bit depth AD and DA converters. By providing all the necessary information (position and time) with each data point collected it can be used for any scan path, using either existing libraries for scan path generation or creating adaptive scan paths using Lua scripting interface. The DSP is also capable of performing statistical calculations, that can be used for decision making during scan or for the scan path optimisation on the DSP level.& COPY; 2023 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).

Klíčová slova

Scanning probe microscopy; Adaptive sampling; Field programmable gate array

Klíčová slova v angličtině

Scanning probe microscopy; Adaptive sampling; Field programmable gate array

Autoři

VALTR, M.; KLAPETEK, P.; MARTINEK, J.; NOVOTNY, O.; JELINEK, Z.; HORTVÍK, V.; NEČAS, D.

Rok RIV

2024

Vydáno

01.09.2023

Nakladatel

ELSEVIER

Místo

AMSTERDAM

ISSN

2468-0672

Periodikum

HardwareX

Svazek

15

Číslo

e00451

Stát

Spojené království Velké Británie a Severního Irska

Strany počet

11

URL

https://www.sciencedirect.com/science/article/pii/S2468067223000585?via%3Dihub

BibTex

@article{BUT187315,
  author="Miroslav {Valtr} and Petr {Klapetek} and Jan {Martinek} and Ondřej {Novotný} and Zdeněk {Jelínek} and Václav {Hortvík} and David {Nečas}",
  title="Scanning Probe Microscopy controller with advanced sampling support",
  journal="HardwareX",
  year="2023",
  volume="15",
  number="e00451",
  pages="11",
  doi="10.1016/j.ohx.2023.e00451",
  url="https://www.sciencedirect.com/science/article/pii/S2468067223000585?via%3Dihub"
}