Detail publikačního výsledku

Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films

MISIUREV, D.; HOLCMAN, V;

Originální název

Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films

Anglický název

Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films

Druh

Stať ve sborníku mimo WoS a Scopus

Originální abstrakt

The paper will provide a brief overview of one of the most popular multiferroic material bismuth ferrite, which was under intense study over the past decades. The reasons why the material earned such a great popularity in recent years will be described in detail. Piezoresponse Force Microscopy (PFM) would be used in order to investigate ferroelectric and magnetic properties of the material. In addition to ferroelectric and magnetic properties, the PFM method reveals the presence of piezo–active regions with different orientation based on their colorations. Samples of 100 nm BiFeO3 material were deposited by using pulsed laser deposition technique on multiplayer substrates Pt/Ti(TiO2)/Si will undergo investigation by PFM. The investigation of produced samples is necessary to determine the topology of produce samples in terms of surface roughness across the investigated surface and potential effect of topology of deposited samples on layout of domains.

Anglický abstrakt

The paper will provide a brief overview of one of the most popular multiferroic material bismuth ferrite, which was under intense study over the past decades. The reasons why the material earned such a great popularity in recent years will be described in detail. Piezoresponse Force Microscopy (PFM) would be used in order to investigate ferroelectric and magnetic properties of the material. In addition to ferroelectric and magnetic properties, the PFM method reveals the presence of piezo–active regions with different orientation based on their colorations. Samples of 100 nm BiFeO3 material were deposited by using pulsed laser deposition technique on multiplayer substrates Pt/Ti(TiO2)/Si will undergo investigation by PFM. The investigation of produced samples is necessary to determine the topology of produce samples in terms of surface roughness across the investigated surface and potential effect of topology of deposited samples on layout of domains.

Klíčová slova

Nanomaterials, multiferroics, ferroelectrics, bismuth ferrite, piezoresponce, polarization.

Klíčová slova v angličtině

Nanomaterials, multiferroics, ferroelectrics, bismuth ferrite, piezoresponce, polarization.

Autoři

MISIUREV, D.; HOLCMAN, V;

Vydáno

01.07.2023

Strany od

410

Strany do

414

Strany počet

5

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2023_sbornik_1.pdf

BibTex

@inproceedings{BUT183667,
  author="Denis {Misiurev} and Vladimír {Holcman}",
  title="Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films",
  year="2023",
  pages="410--414",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2023_sbornik_1.pdf"
}