Detail publikačního výsledku

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

GU, J.; VAN KRIEKEN, R.; ŠTUMPF, M.; LAGER, I.

Originální název

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

Anglický název

Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

A simple and efficacious modality of introducing causal excitations in CST Studio Suite time-domain simulations is described. It makes use of (concatenations of) so-called discrete ports that are shown to accurately substitute Dirichlet boundary conditions and replicate dipole excitations. Numerical experiments cogently demonstrate the approach's exceptional replication accuracy and computational effectiveness.

Anglický abstrakt

A simple and efficacious modality of introducing causal excitations in CST Studio Suite time-domain simulations is described. It makes use of (concatenations of) so-called discrete ports that are shown to accurately substitute Dirichlet boundary conditions and replicate dipole excitations. Numerical experiments cogently demonstrate the approach's exceptional replication accuracy and computational effectiveness.

Klíčová slova

computational electromagnetics; time-domain analysis; numerical analysis.

Klíčová slova v angličtině

computational electromagnetics; time-domain analysis; numerical analysis.

Autoři

GU, J.; VAN KRIEKEN, R.; ŠTUMPF, M.; LAGER, I.

Rok RIV

2023

Vydáno

29.09.2022

Nakladatel

IEEE

Místo

New York

ISBN

978-2-87487-068-2

Kniha

European Microwave Week 2022 Conference Proceedings

Strany od

234

Strany do

237

Strany počet

4

URL

https://ieeexplore.ieee.org/abstract/document/9924345

BibTex

@inproceedings{BUT179822,
  author="GU, J. and VAN KRIEKEN, R. and ŠTUMPF, M. and LAGER, I.",
  title="Excitation in Time-Domain Analyses: A Pivotal Element for Accurate Simulations",
  booktitle="European Microwave Week 2022 Conference Proceedings",
  year="2022",
  pages="234--237",
  publisher="IEEE",
  address="New York",
  doi="10.23919/EuMC54642.2022.9924345",
  isbn="978-2-87487-068-2",
  url="https://ieeexplore.ieee.org/abstract/document/9924345"
}