Detail publikačního výsledku

Two-dimensional quantitative near-field phase imaging using square and hexagonal interference devices

DVOŘÁK, P.; KLOK, P.; KVAPIL, M.; HRTOŇ, M.; BOUCHAL, P.; KRPENSKÝ, J.; KŘÁPEK, V.; ŠIKOLA, T.

Originální název

Two-dimensional quantitative near-field phase imaging using square and hexagonal interference devices

Anglický název

Two-dimensional quantitative near-field phase imaging using square and hexagonal interference devices

Druh

Článek WoS

Originální abstrakt

We demonstrate the formation of the near field with non-trivial phase distribution using surface plasmon interference devices, and experimental quantitative imaging of that phase with near-field phase microscopy. The phase distribution formed with a single device can be controlled by the polarization of the external illumination and the area of the device assigned to the object wave. A comparison of the experimental data to a numerical electromagnetic model and an analytical model assigns the origin of the near-field phase to the out-of-plane electric component of surface plasmon polaritons, and also verifies the predictive power of the models. We demonstrate a formation of near-field plane waves with different propagation directions on a single device, or even simultaneously at distinct areas of a single device. Our findings open the way to the imaging and tomography of phase objects in the near field.

Anglický abstrakt

We demonstrate the formation of the near field with non-trivial phase distribution using surface plasmon interference devices, and experimental quantitative imaging of that phase with near-field phase microscopy. The phase distribution formed with a single device can be controlled by the polarization of the external illumination and the area of the device assigned to the object wave. A comparison of the experimental data to a numerical electromagnetic model and an analytical model assigns the origin of the near-field phase to the out-of-plane electric component of surface plasmon polaritons, and also verifies the predictive power of the models. We demonstrate a formation of near-field plane waves with different propagation directions on a single device, or even simultaneously at distinct areas of a single device. Our findings open the way to the imaging and tomography of phase objects in the near field.

Klíčová slova

interference nanostructures; near-field; phase imaging; SNOM; SPP waves

Klíčová slova v angličtině

interference nanostructures; near-field; phase imaging; SNOM; SPP waves

Autoři

DVOŘÁK, P.; KLOK, P.; KVAPIL, M.; HRTOŇ, M.; BOUCHAL, P.; KRPENSKÝ, J.; KŘÁPEK, V.; ŠIKOLA, T.

Rok RIV

2023

Vydáno

26.08.2022

Nakladatel

De Gruyter

Místo

BERLIN

ISSN

2192-8614

Periodikum

Nanophotonics

Svazek

11

Číslo

19

Stát

Spolková republika Německo

Strany od

1

Strany do

12

Strany počet

12

URL

https://www.degruyter.com/document/doi/10.1515/nanoph-2022-0215/html

Plný text v Digitální knihovně

http://hdl.handle.net/11012/208473

BibTex

@article{BUT178969,
  author="Petr {Viewegh} and Pavel {Klok} and Michal {Kvapil} and Martin {Hrtoň} and Petr {Bouchal} and Jan {Krpenský} and Vlastimil {Křápek} and Tomáš {Šikola}",
  title="Two-dimensional quantitative near-field phase imaging using square and hexagonal interference devices",
  journal="Nanophotonics",
  year="2022",
  volume="11",
  number="19",
  pages="1--12",
  doi="10.1515/nanoph-2022-0215",
  issn="2192-8606",
  url="https://www.degruyter.com/document/doi/10.1515/nanoph-2022-0215/html"
}

Dokumenty

10.1515_nanoph-2022-0215