Detail publikačního výsledku

Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

RAMAZANOV, S.; ŢĂLU, Ş.; DALLAEV, R.; RAMAZANOV, G.; ŠKARVADA, P.; OULEHLA, J.; SOBOLA, D.; NAZAROV, D.

Originální název

Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

Anglický název

Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

In this study a comparison of the topography of BiFeO3 (BFO) thin films deposited on tantalum pentoxide substrates of different thicknesses is provided. The Ta2O5 substrates had a roughness increasing with the film thickness. The relationship between substrates of different topography but the same composition with the quality of the growing bismuth ferrite film is estimated. For the first time the topography estimation of BFO on Ta2O5 is presented. The difference in temperature expansion coefficients leads to intensive evaporation of bismuth ferrite from the surface during annealing. XPS analysis is provided for asdeposited and annealed BFO layers.

Anglický abstrakt

In this study a comparison of the topography of BiFeO3 (BFO) thin films deposited on tantalum pentoxide substrates of different thicknesses is provided. The Ta2O5 substrates had a roughness increasing with the film thickness. The relationship between substrates of different topography but the same composition with the quality of the growing bismuth ferrite film is estimated. For the first time the topography estimation of BFO on Ta2O5 is presented. The difference in temperature expansion coefficients leads to intensive evaporation of bismuth ferrite from the surface during annealing. XPS analysis is provided for asdeposited and annealed BFO layers.

Klíčová slova

bismuth ferrite, tantalum pentoxide, spectroscopy

Klíčová slova v angličtině

bismuth ferrite, tantalum pentoxide, spectroscopy

Autoři

RAMAZANOV, S.; ŢĂLU, Ş.; DALLAEV, R.; RAMAZANOV, G.; ŠKARVADA, P.; OULEHLA, J.; SOBOLA, D.; NAZAROV, D.

Rok RIV

2022

Vydáno

26.07.2021

Nakladatel

EDP Sciences

Kniha

International Scientific Forum on Sustainable Development and Innovation (WFSDI 2021)

ISSN

2267-1242

Periodikum

E3S Web of Conferences

Svazek

295

Číslo

1

Stát

Francouzská republika

Strany od

1

Strany do

7

Strany počet

7

URL

https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html

Plný text v Digitální knihovně

http://hdl.handle.net/11012/203039

BibTex

@inproceedings{BUT172164,
  author="Shikhgasan {Ramazanov} and Ştefan {Ţălu} and Rashid {Dallaev} and Gusejn {Ramazanov} and Pavel {Škarvada} and Jindřich {Oulehla} and Dinara {Sobola} and Dmitry {Nazarov}",
  title="Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers",
  booktitle="International Scientific Forum on Sustainable Development and Innovation (WFSDI 2021)",
  year="2021",
  journal="E3S Web of Conferences",
  volume="295",
  number="1",
  pages="1--7",
  publisher="EDP Sciences",
  doi="10.1051/e3sconf/202129504009",
  issn="2267-1242",
  url="https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html"
}

Dokumenty

e3sconf_wfsdi2021_04009_surf_morph