Detail publikačního výsledku

SEM imaging and XPS characterization of doped PVDF fibers

SMEJKALOVÁ, T.; ŢĂLU, Ş.; DALLAEV, R.; ČÁSTKOVÁ, K.; SOBOLA, D.; NAZAROV, A.

Originální název

SEM imaging and XPS characterization of doped PVDF fibers

Anglický název

SEM imaging and XPS characterization of doped PVDF fibers

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Polyvinylidene fluoride (PVDF) is one of the most promising electroactive polymers; it exhibits excellent electroactive behaviours, good biocompatibility, excellent chemical resistance, and thermal stability, rendering it an attractive material for biomedical, electronic, environmental and energy harvesting applications. This work aims to further improve its properties by the inclusion of powders of piezoactive materials. Polyvinylidene fluoride was formed by electrospinning into fibres with a thickness of 1.5-0.3 µm and then examined in a scanning electron microscope. The work offers a description of the current procedure in the preparation of samples and their modification for examination in a scanning electron microscope, characterizes the individual components of doped fibres and deals with specific instruments used for various analytical methods. The work contains a theoretical introduction to the analytical methods to which the samples will be further subjected, such as energy dispersive X-ray spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS). The obtained excellent properties of doped PVDF could be used in the design of sensors

Anglický abstrakt

Polyvinylidene fluoride (PVDF) is one of the most promising electroactive polymers; it exhibits excellent electroactive behaviours, good biocompatibility, excellent chemical resistance, and thermal stability, rendering it an attractive material for biomedical, electronic, environmental and energy harvesting applications. This work aims to further improve its properties by the inclusion of powders of piezoactive materials. Polyvinylidene fluoride was formed by electrospinning into fibres with a thickness of 1.5-0.3 µm and then examined in a scanning electron microscope. The work offers a description of the current procedure in the preparation of samples and their modification for examination in a scanning electron microscope, characterizes the individual components of doped fibres and deals with specific instruments used for various analytical methods. The work contains a theoretical introduction to the analytical methods to which the samples will be further subjected, such as energy dispersive X-ray spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS). The obtained excellent properties of doped PVDF could be used in the design of sensors

Klíčová slova

PVDF, SEM, XPS

Klíčová slova v angličtině

PVDF, SEM, XPS

Autoři

SMEJKALOVÁ, T.; ŢĂLU, Ş.; DALLAEV, R.; ČÁSTKOVÁ, K.; SOBOLA, D.; NAZAROV, A.

Rok RIV

2021

Vydáno

10.06.2021

Nakladatel

EDP Sciences

Kniha

WFCES 2021

ISSN

2267-1242

Periodikum

E3S Web of Conferences

Svazek

270

Číslo

1

Stát

Francouzská republika

Strany od

1

Strany do

14

Strany počet

14

URL

https://www.e3s-conferences.org/articles/e3sconf/abs/2021/46/e3sconf_wfces2021_01011/e3sconf_wfces2021_01011.html

Plný text v Digitální knihovně

http://hdl.handle.net/11012/200969

BibTex

@inproceedings{BUT171780,
  author="Tereza {Smejkalová} and Ştefan {Ţălu} and Rashid {Dallaev} and Klára {Částková} and Dinara {Sobola} and Anton {Nazarov}",
  title="SEM imaging and XPS characterization of doped PVDF fibers",
  booktitle="WFCES 2021",
  year="2021",
  journal="E3S Web of Conferences",
  volume="270",
  number="1",
  pages="1--14",
  publisher="EDP Sciences",
  doi="10.1051/e3sconf/202127001011",
  issn="2267-1242",
  url="https://www.e3s-conferences.org/articles/e3sconf/abs/2021/46/e3sconf_wfces2021_01011/e3sconf_wfces2021_01011.html"
}

Dokumenty

e3sconf_wfces2021_01011