Detail publikačního výsledku

Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence

STÖGER-POLLACH, M.; LÖFFLER, S.; MAURER, N.; BUKVIŠOVÁ, K.

Originální název

Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence

Anglický název

Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence

Druh

Článek WoS

Originální abstrakt

Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Perot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).

Anglický abstrakt

Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Perot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).

Klíčová slova

Cerenkov; Radiation; Cathodoluminescence; VEELS

Klíčová slova v angličtině

Cerenkov; Radiation; Cathodoluminescence; VEELS

Autoři

STÖGER-POLLACH, M.; LÖFFLER, S.; MAURER, N.; BUKVIŠOVÁ, K.

Rok RIV

2021

Vydáno

01.07.2020

Nakladatel

Elsevier

Místo

AMSTERDAM

ISSN

0304-3991

Periodikum

ULTRAMICROSCOPY

Svazek

214

Číslo

1

Stát

Nizozemsko

Strany od

1

Strany do

5

Strany počet

5

URL

Plný text v Digitální knihovně

BibTex

@article{BUT165496,
  author="Michael {Stöger-Pollach} and Stefan {Löffler} and Niklas {Maurer} and Kristýna {Bukvišová}",
  title="Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence",
  journal="ULTRAMICROSCOPY",
  year="2020",
  volume="214",
  number="1",
  pages="1--5",
  doi="10.1016/j.ultramic.2020.113011",
  issn="0304-3991",
  url="https://www.sciencedirect.com/science/article/pii/S0304399120300073"
}

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