Frequency and temperature-dependent electric modulus spectroscopy of osmium-doped YbFeO3 structure

Frequency and temperature-dependent electric modulus spectroscopy of osmium-doped YbFeO3 structure

Článek WoS

Orthoferrites have occupied important place in the material science and condensed matter physics investigations due to their unique features such as electrical, magnetic and optical. The present investigation illuminates light on the electrical properties of osmium (Os) doped YbFeO3 (YbFO) rare-earth orthoferrite. The undoped YbFO and YbFe1-xOsxO3 (YbFOO) (x = 0.01 and 0.05) powders were synthesized via solid-state. X-ray diffractometer (XRD) has been utilized to examine the crystal structure of the YbFO and YbFOO powders. The cross sectional morphology of the obtained pellets was inspected via scanning electron microscope (SEM). Moreover, x-ray photoelectron spectroscopy was exploited to determine the oxidation states of the constituted elements. The electrical features for instance electrical modulus, dielectric constant and conductivity of the synthesized pellets were detailed at different frequencies and temperatures by dielectric/impedance spectroscopy studies. The x = 0.01 Os doped sample exhibits higher dielectric constant and conductivity compared to other samples. Moreover, in order to explain conductivity mechanism of the studied samples, multiple conduction models are needed to employ.

Orthoferrites have occupied important place in the material science and condensed matter physics investigations due to their unique features such as electrical, magnetic and optical. The present investigation illuminates light on the electrical properties of osmium (Os) doped YbFeO3 (YbFO) rare-earth orthoferrite. The undoped YbFO and YbFe1-xOsxO3 (YbFOO) (x = 0.01 and 0.05) powders were synthesized via solid-state. X-ray diffractometer (XRD) has been utilized to examine the crystal structure of the YbFO and YbFOO powders. The cross sectional morphology of the obtained pellets was inspected via scanning electron microscope (SEM). Moreover, x-ray photoelectron spectroscopy was exploited to determine the oxidation states of the constituted elements. The electrical features for instance electrical modulus, dielectric constant and conductivity of the synthesized pellets were detailed at different frequencies and temperatures by dielectric/impedance spectroscopy studies. The x = 0.01 Os doped sample exhibits higher dielectric constant and conductivity compared to other samples. Moreover, in order to explain conductivity mechanism of the studied samples, multiple conduction models are needed to employ.

orthoferrite YbFeO3 (YbFO); osmium (Os) doping; ceramic; solid-state method; electrical properties; scanning electron microscope (SEM); x-ray photoelectron spectroscopy (XPS)

orthoferrite YbFeO3 (YbFO); osmium (Os) doping; ceramic; solid-state method; electrical properties; scanning electron microscope (SEM); x-ray photoelectron spectroscopy (XPS)

Polat, O.; Coskun, M.; Kalousek, R.; Zlamal, J.; Kurt, BZ.; Caglar, Y.; Caglar, M.; Turut, A.

2021

06.02.2020

IOP PUBLISHING LTD

BRISTOL

0953-8984

JOURNAL OF PHYSICS-CONDENSED MATTER

32

6

Spojené království Velké Británie a Severního Irska

065701

065701

17

https://iopscience.iop.org/article/10.1088/1361-648X/ab4daa

Frequency and Temperature-Dependent Electric Modulus Spectroscopy of Os Doped YbFeO3 Structure