Detail publikačního výsledku

CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

ŠALPLACHTA, J.; ZIKMUND, T.; HORVÁTH, M., TAKEDA, Y., OMOTE, K., PÍNA, L., KAISER, J.

Originální název

CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

Anglický název

CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

The key component of any CT (X-ray computed tomography) machine is a detection system. In area of scientific CT imaging applications three types of sensors are mainly used. These are amorphous silicon (α-Si) flat panels, complementary metal–oxide–semiconductor (CMOS) and charge-coupled device (CCD) sensors. Here the performance and comparison study of the two lastly named sensor types is conducted in field of high resolution CT imaging. CCD and novel sCMOS-based (scientific CMOS) detection systems are tested using high-resolution laboratory-based Rigaku nano3DX system (ability to achieve submicron voxel resolution). Properties of each camera were evaluated as well as the quality and noise properties of acquired data (both projectionand CT data).

Anglický abstrakt

The key component of any CT (X-ray computed tomography) machine is a detection system. In area of scientific CT imaging applications three types of sensors are mainly used. These are amorphous silicon (α-Si) flat panels, complementary metal–oxide–semiconductor (CMOS) and charge-coupled device (CCD) sensors. Here the performance and comparison study of the two lastly named sensor types is conducted in field of high resolution CT imaging. CCD and novel sCMOS-based (scientific CMOS) detection systems are tested using high-resolution laboratory-based Rigaku nano3DX system (ability to achieve submicron voxel resolution). Properties of each camera were evaluated as well as the quality and noise properties of acquired data (both projectionand CT data).

Klíčová slova

X-ray imaging, X-ray Computed Tomography, image detectors, CCD, sCMOS, image quality evaluation

Klíčová slova v angličtině

X-ray imaging, X-ray Computed Tomography, image detectors, CCD, sCMOS, image quality evaluation

Autoři

ŠALPLACHTA, J.; ZIKMUND, T.; HORVÁTH, M., TAKEDA, Y., OMOTE, K., PÍNA, L., KAISER, J.

Rok RIV

2019

Vydáno

04.03.2019

Nakladatel

NDT.net

ISSN

1435-4934

Periodikum

The e-Journal of Nondestructive Testing

Číslo

2019

Stát

Spolková republika Německo

Strany od

1

Strany do

8

Strany počet

8

URL

https://www.ndt.net/search/docs.php3?showForm=off&id=23697

BibTex

@article{BUT156650,
  author="Jakub {Šalplachta} and Tomáš {Zikmund} and Jozef {Kaiser}",
  title="CCD and scientific-CMOS detectors for submicron laboratory based X-ray
Computed Tomography",
  journal="The e-Journal of Nondestructive Testing",
  year="2019",
  number="2019",
  pages="1--8",
  issn="1435-4934",
  url="https://www.ndt.net/search/docs.php3?showForm=off&id=23697"
}