Detail publikačního výsledku

How topographical surface parameters are correlated with CdTe monocrystal surface oxidation

TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O.

Originální název

How topographical surface parameters are correlated with CdTe monocrystal surface oxidation

Anglický název

How topographical surface parameters are correlated with CdTe monocrystal surface oxidation

Druh

Článek WoS

Originální abstrakt

Numerical analysis was applied to three-dimensional (3D) images for a quantitative description of evolution of surface topography of CdTe after oxidation. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Surface texture analysis provides dependence of topography characteristics on oxidation process. The comprehensive description of the surface micromorphology of the CdTe is an important challenge and it is essential for understanding their properties and their potential technological exploitation. The changes in surface topography were evaluated by atomic force microscopy (AFM). This characterization was carried out for the quantitative analysis of specific microstructural characteristics of samples.

Anglický abstrakt

Numerical analysis was applied to three-dimensional (3D) images for a quantitative description of evolution of surface topography of CdTe after oxidation. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Surface texture analysis provides dependence of topography characteristics on oxidation process. The comprehensive description of the surface micromorphology of the CdTe is an important challenge and it is essential for understanding their properties and their potential technological exploitation. The changes in surface topography were evaluated by atomic force microscopy (AFM). This characterization was carried out for the quantitative analysis of specific microstructural characteristics of samples.

Klíčová slova

CdTe monocrystals; Atomic force microscopy; Fractal analysis; Surface oxidation; Surface morphology

Klíčová slova v angličtině

CdTe monocrystals; Atomic force microscopy; Fractal analysis; Surface oxidation; Surface morphology

Autoři

TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O.

Rok RIV

2019

Vydáno

31.05.2018

Nakladatel

Elsevier

ISSN

1369-8001

Periodikum

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Číslo

85

Stát

Spojené království Velké Británie a Severního Irska

Strany od

15

Strany do

23

Strany počet

9

URL

https://www.sciencedirect.com/science/article/pii/S1369800118303639

BibTex

@article{BUT147823,
  author="Stefan {Talu} and Ram Pratap {Yadav} and Ondřej {Šik} and Dinara {Sobola} and Rashid {Dallaev} and Shahram {Solaymani} and Ondřej {Man}",
  title="How topographical surface parameters are correlated with CdTe monocrystal surface oxidation",
  journal="MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING",
  year="2018",
  number="85",
  pages="15--23",
  doi="10.1016/j.mssp.2018.05.030",
  issn="1369-8001",
  url="https://www.sciencedirect.com/science/article/pii/S1369800118303639"
}