Detail publikačního výsledku

High resolution measuring with X-ray computed tomography

BŘÍNEK, A.; TESAŘOVÁ, M.; ZIKMUND, T.; KAISER, J.

Originální název

High resolution measuring with X-ray computed tomography

Anglický název

High resolution measuring with X-ray computed tomography

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The ability to inspect the interior of an object in a nondestructive was is of fundamental importance in a wide range of academic and industrial applications, raging from life science research, to medical diagnosis. X-ray tomography provides a tool to obtain 3D image of the object computed by the reconstruction algorithm. In recent years, significant progress has been made in the field of advanced X-ray computed tomography (CT) imaging, pushing the limit of voxel resolution far beyond 1 micrometer. On the four samples are shown the possibilities of achieved resolutions.

Anglický abstrakt

The ability to inspect the interior of an object in a nondestructive was is of fundamental importance in a wide range of academic and industrial applications, raging from life science research, to medical diagnosis. X-ray tomography provides a tool to obtain 3D image of the object computed by the reconstruction algorithm. In recent years, significant progress has been made in the field of advanced X-ray computed tomography (CT) imaging, pushing the limit of voxel resolution far beyond 1 micrometer. On the four samples are shown the possibilities of achieved resolutions.

Klíčová slova

X-ray computed tomography, high resolution measuring,

Klíčová slova v angličtině

X-ray computed tomography, high resolution measuring,

Autoři

BŘÍNEK, A.; TESAŘOVÁ, M.; ZIKMUND, T.; KAISER, J.

Rok RIV

2018

Vydáno

20.04.2017

Místo

Telč

ISBN

9788021085503

Kniha

Book of Abstracts CEITEC PhD Retreat II

Strany od

69

Strany do

69

Strany počet

138

BibTex

@inproceedings{BUT137872,
  author="Adam {Břínek} and Markéta {Kaiser} and Tomáš {Zikmund} and Jozef {Kaiser}",
  title="High resolution measuring with X-ray computed tomography",
  booktitle="Book of Abstracts CEITEC PhD Retreat II",
  year="2017",
  pages="69--69",
  address="Telč",
  isbn="9788021085503"
}