Detail publikačního výsledku

SILICON SOLAR CELL PARAMETERS CHANGE AFTER FOCUSED ION BEAM MILLING

GAJDOŠ, A.

Originální název

SILICON SOLAR CELL PARAMETERS CHANGE AFTER FOCUSED ION BEAM MILLING

Anglický název

SILICON SOLAR CELL PARAMETERS CHANGE AFTER FOCUSED ION BEAM MILLING

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Silicon is still one of the most used materials for fabrication of solar cells. Some imper- fections and defects may appear during production process. These local imperfections could be eliminated by focused ion beam (FIB). Nevertheless, FIB milling process modifies the crystal structure of the material by ions implantation. Samples under investigation are monocrystalline sili- con solar cells. The impact of FIB milling is shown and discussed through current-voltage measu- rement before and after milling process.

Anglický abstrakt

Silicon is still one of the most used materials for fabrication of solar cells. Some imper- fections and defects may appear during production process. These local imperfections could be eliminated by focused ion beam (FIB). Nevertheless, FIB milling process modifies the crystal structure of the material by ions implantation. Samples under investigation are monocrystalline sili- con solar cells. The impact of FIB milling is shown and discussed through current-voltage measu- rement before and after milling process.

Klíčová slova

Silicon, solar cell, focused ion beam, I-V curve, SEM

Klíčová slova v angličtině

Silicon, solar cell, focused ion beam, I-V curve, SEM

Autoři

GAJDOŠ, A.

Rok RIV

2018

Vydáno

27.04.2017

Nakladatel

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních

Místo

Brno

ISBN

978-80-214-5496-5

Kniha

Proceedings of the 23 rd Conference STUDENT EEICT 2017

Strany od

665

Strany do

669

Strany počet

5

URL

http://eeict.feec.vutbr.cz/2017/sbornik/EEICT_2017-sbornik-komplet-2.pdf

BibTex

@inproceedings{BUT136041,
  author="Adam {Gajdoš}",
  title="SILICON SOLAR CELL PARAMETERS CHANGE AFTER
FOCUSED ION BEAM MILLING",
  booktitle="Proceedings of the 23 rd Conference STUDENT EEICT 2017",
  year="2017",
  number="první",
  pages="665--669",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních",
  address="Brno",
  isbn="978-80-214-5496-5",
  url="http://eeict.feec.vutbr.cz/2017/sbornik/EEICT_2017-sbornik-komplet-2.pdf"
}