Detail publikačního výsledku

FEM Model of the Lithium Ion Battery Nail Test

VYROUBAL, P.; KAZDA, T.; BAYER, R.

Originální název

FEM Model of the Lithium Ion Battery Nail Test

Anglický název

FEM Model of the Lithium Ion Battery Nail Test

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Internal short-circuit is the most dangerous abusive condition for Li-ion batteries and has been the root cause for several catastrophic accidents involving Li-ion batteries in recent years. Large-format Li-ion batteries are particularly vulnerable to internal short-circuits because of high energy content. Nail penetration test is commonly used to study the internal short-circuits, but the test results usually have poor reproducibility and offer limited insight. This paper deals with a possibility of numerical simulation of internal short circuit test using FEM.

Anglický abstrakt

Internal short-circuit is the most dangerous abusive condition for Li-ion batteries and has been the root cause for several catastrophic accidents involving Li-ion batteries in recent years. Large-format Li-ion batteries are particularly vulnerable to internal short-circuits because of high energy content. Nail penetration test is commonly used to study the internal short-circuits, but the test results usually have poor reproducibility and offer limited insight. This paper deals with a possibility of numerical simulation of internal short circuit test using FEM.

Klíčová slova

Short-circuit, Lithium Ion Battery, model, Nail Test

Klíčová slova v angličtině

Short-circuit, Lithium Ion Battery, model, Nail Test

Autoři

VYROUBAL, P.; KAZDA, T.; BAYER, R.

Rok RIV

2017

Vydáno

12.12.2016

ISBN

978-80-214-5109-4

Kniha

ECS Transactions

ISSN

1938-5862

Periodikum

ECS Transactions

Stát

Spojené státy americké

Strany od

71

Strany do

75

Strany počet

5

BibTex

@inproceedings{BUT129452,
  author="Petr {Vyroubal} and Tomáš {Kazda} and Robert {Bayer}",
  title="FEM Model of the Lithium Ion Battery Nail Test",
  booktitle="ECS Transactions",
  year="2016",
  journal="ECS Transactions",
  number="74",
  pages="71--75",
  doi="10.1149/07401.0071ecst",
  isbn="978-80-214-5109-4",
  issn="1938-5862"
}