Detail publikačního výsledku

Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Veronika Novotná

Originální název

Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Anglický název

Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This paper deals with usage of a low voltage STEM for biological purposes. The investigation of electron beam induced mass loss of ultrathin sections of three embedding media is presented. The mass loss of the sample caused by the electron bombardment is not examined in detail in the literature but it seems to be an important fact in investigation of biological samples by low voltage STEM. The samples of different thickness were investigated using different microscope settings (acceleration voltage, total dose, probe current, cleaning of the sample surface) and STEM imaging modes (bright-field, dark-field).

Anglický abstrakt

This paper deals with usage of a low voltage STEM for biological purposes. The investigation of electron beam induced mass loss of ultrathin sections of three embedding media is presented. The mass loss of the sample caused by the electron bombardment is not examined in detail in the literature but it seems to be an important fact in investigation of biological samples by low voltage STEM. The samples of different thickness were investigated using different microscope settings (acceleration voltage, total dose, probe current, cleaning of the sample surface) and STEM imaging modes (bright-field, dark-field).

Klíčová slova

STEM, Mass loss, Embedding media, Total irradiated dose

Klíčová slova v angličtině

STEM, Mass loss, Embedding media, Total irradiated dose

Autoři

Veronika Novotná

Rok RIV

2016

Vydáno

05.05.2014

Nakladatel

LITERA

Místo

Brno

ISBN

978-80-214-4923-7

Kniha

Student EEICT - Proceedings of the 20th conference

Strany od

139

Strany do

141

Strany počet

288

BibTex

@inproceedings{BUT121043,
  author="Veronika {Novotná}",
  title="Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM",
  booktitle="Student EEICT - Proceedings of the 20th conference",
  year="2014",
  number="1",
  pages="139--141",
  publisher="LITERA",
  address="Brno",
  isbn="978-80-214-4923-7"
}