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Detail publikačního výsledku
VANĚK, J.; CHOBOLA, Z.; LUŇÁK, M.
Originální název
Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With Very High Efficiency
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
This paper deals with comparisons of noise spectroscopy, I-V characteristic and microplasma detection of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generation-recombination types. G-R noise and burst noise is not fundamental noise and therefore can by use as a quality indicator.
Anglický abstrakt
Klíčová slova
photovoltaic cell, concentrator, noise spectroscopy, microplasma
Klíčová slova v angličtině
Autoři
Rok RIV
2016
Vydáno
10.12.2015
Nakladatel
ECS Transaction
Místo
USA
ISBN
978-80-214-5109-4
Kniha
ECS Trans. 2015 70(1)
ISSN
1938-5862
Periodikum
ECS Transactions
Svazek
70
Číslo
1
Stát
Spojené státy americké
Strany od
245
Strany do
253
Strany počet
8
BibTex
@inproceedings{BUT120033, author="Jiří {Vaněk} and Zdeněk {Chobola} and Miroslav {Luňák}", title="Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With Very High Efficiency", booktitle="ECS Trans. 2015 70(1)", year="2015", journal="ECS Transactions", volume="70", number="1", pages="245--253", publisher="ECS Transaction", address="USA", doi="10.1149/07001.0245ecst", isbn="978-80-214-5109-4", issn="1938-5862" }