Detail publikace

Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency

CHOBOLA, Z. LUŇÁK, M. VANĚK, J. DOLENSKÝ, J. BAŘINKA, R.

Originální název

Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency

Anglický název

Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency

Jazyk

en

Originální abstrakt

This paper deals with comparisons of noise spectroscopy and I-V characteristic of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generationrecombination types. G-r noise and burst noise is not fundamental noise and therefore can by use as quality indicator. For the determination of a possible noise source there was used the microplasma detection method and ESEM displaying.

Anglický abstrakt

This paper deals with comparisons of noise spectroscopy and I-V characteristic of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generationrecombination types. G-r noise and burst noise is not fundamental noise and therefore can by use as quality indicator. For the determination of a possible noise source there was used the microplasma detection method and ESEM displaying.

Dokumenty

BibTex 


@inproceedings{BUT118906,
  author="Zdeněk {Chobola} and Miroslav {Luňák} and Jiří {Vaněk} and Jan {Dolenský} and Radim {Bařinka}",
  title="Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency
",
  annote="This paper deals with comparisons of noise spectroscopy and I-V characteristic of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generationrecombination types. G-r noise and burst noise is not fundamental noise and therefore can by use as quality indicator. For the determination of a possible noise source there was used the microplasma detection method and ESEM displaying.",
  address="WIP",
  booktitle="Proceedings of 31st European PV Solar Energy Conference and Exhibition",
  chapter="118906",
  doi="10.4229/EUPVSEC20152015-5BV.4.25",
  howpublished="electronic, physical medium",
  institution="WIP",
  number="20515",
  year="2015",
  month="september",
  pages="2449--2452",
  publisher="WIP",
  type="conference paper"
}