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Detail publikačního výsledku
CHOBOLA, Z.; LUŇÁK, M.; VANĚK, J.; DOLENSKÝ, J.; BAŘINKA, R.
Originální název
Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
This paper deals with comparisons of noise spectroscopy and I-V characteristic of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generationrecombination types. G-r noise and burst noise is not fundamental noise and therefore can by use as quality indicator. For the determination of a possible noise source there was used the microplasma detection method and ESEM displaying.
Anglický abstrakt
Klíčová slova
Concentrators, Crystalline, Epitaxy, Solar cell, ESEM displaying
Klíčová slova v angličtině
Autoři
Rok RIV
2016
Vydáno
18.09.2015
Nakladatel
WIP
Místo
Hamburg
ISBN
3-936338-39-6
Kniha
Proceedings of 31st European PV Solar Energy Conference and Exhibition
ISSN
2196-0992
Periodikum
EU PVSEC 2014 Proceedings DVD
Svazek
1
Číslo
20515
Stát
Spolková republika Německo
Strany od
2449
Strany do
2452
Strany počet
4
BibTex
@inproceedings{BUT118906, author="Zdeněk {Chobola} and Miroslav {Luňák} and Jiří {Vaněk} and Jan {Dolenský} and Radim {Bařinka}", title="Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency ", booktitle="Proceedings of 31st European PV Solar Energy Conference and Exhibition", year="2015", journal="EU PVSEC 2014 Proceedings DVD", volume="1", number="20515", pages="2449--2452", publisher="WIP", address="Hamburg", doi="10.4229/EUPVSEC20152015-5BV.4.25", isbn="3-936338-39-6", issn="2196-0992" }