Detail publikace

Low-frequency noise measurements used for quality assessment of GaSb based laser diodes prepared by molecular beam epitaxy

CHOBOLA, Z. LUŇÁK, M. VANĚK, J. HULICIUS, E. KUSÁK, I.

Originální název

Low-frequency noise measurements used for quality assessment of GaSb based laser diodes prepared by molecular beam epitaxy

Anglický název

Low-frequency noise measurements used for quality assessment of GaSb based laser diodes prepared by molecular beam epitaxy

Jazyk

en

Originální abstrakt

The paper reports on a non-destructive method of reliability prediction for semiconductor lasers diodes GaSb based VCSE. Transport and noise characteristic of forward biased were measured in order to evaluate the new MBE technology.

Anglický abstrakt

The paper reports on a non-destructive method of reliability prediction for semiconductor lasers diodes GaSb based VCSE. Transport and noise characteristic of forward biased were measured in order to evaluate the new MBE technology.

Plný text v Digitální knihovně

http://hdl.handle.net/11012/84115

Dokumenty

BibTex 


@article{BUT117577,
  author="Zdeněk {Chobola} and Miroslav {Luňák} and Jiří {Vaněk} and Eduard {Hulicius} and Ivo {Kusák}",
  title="Low-frequency noise measurements used for quality assessment of GaSb based laser diodes prepared by molecular beam epitaxy",
  annote="The paper reports on a non-destructive method of reliability prediction for semiconductor lasers diodes GaSb based VCSE. Transport and noise characteristic of forward biased were measured in order to evaluate the new MBE technology.",
  address="Faculty of Electrical Engineering and Information Technology of the Slovak University of Technology",
  chapter="117577",
  doi="10.2478/jee-2015-0036",
  howpublished="print",
  institution="Faculty of Electrical Engineering and Information Technology of the Slovak University of Technology",
  number="4",
  volume="66",
  year="2015",
  month="august",
  pages="226--230",
  publisher="Faculty of Electrical Engineering and Information Technology of the Slovak University of Technology",
  type="journal article in Web of Science"
}