Detail publikace

Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes

VANĚK, J., BRZOKOUPIL, V., CHOBOLA, Z., ŠIMEČEK, T.

Originální název

Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes

Anglický název

Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes

Jazyk

en

Originální abstrakt

Transport and noise characteristic of forward biased 2.3 CW GaSb laser diodes were measured in order to evaluate new technology.

Anglický abstrakt

Transport and noise characteristic of forward biased 2.3 CW GaSb laser diodes were measured in order to evaluate new technology.

Dokumenty

BibTex 


@inproceedings{BUT11726,
  author="Jiří {Vaněk} and Vladimír {Brzokoupil} and Zdeněk {Chobola} and Tomáš {Šimeček}",
  title="Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes",
  annote="Transport and noise characteristic of forward biased 2.3 CW GaSb laser diodes were measured in order to evaluate new technology.",
  address="Akademické nakladatelství CERM",
  booktitle="Research Activities f Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republic",
  chapter="11726",
  institution="Akademické nakladatelství CERM",
  year="2004",
  month="september",
  pages="184",
  publisher="Akademické nakladatelství CERM",
  type="conference paper"
}