Detail publikačního výsledku

Methodics of characterisation for the cold field-emission sources intended for electron microscopy

ŠTRBKOVÁ, L.

Originální název

Methodics of characterisation for the cold field-emission sources intended for electron microscopy

Anglický název

Methodics of characterisation for the cold field-emission sources intended for electron microscopy

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The paper deals with the characterization method of the electron emitter for an electron microscope – Fowler-Nordheim analysis. The method is based on the presence of quantum tunnelling, which occurs during the field emission of electrons. The analysis consists of the computation of the essential characteristics of the emitter. These characteristics determine the overall quality of electron emission, as well as provide information about the actual condition of the emitter.

Anglický abstrakt

The paper deals with the characterization method of the electron emitter for an electron microscope – Fowler-Nordheim analysis. The method is based on the presence of quantum tunnelling, which occurs during the field emission of electrons. The analysis consists of the computation of the essential characteristics of the emitter. These characteristics determine the overall quality of electron emission, as well as provide information about the actual condition of the emitter.

Klíčová slova

field emission, Fowler-Nordheim analysis, finite element method

Klíčová slova v angličtině

field emission, Fowler-Nordheim analysis, finite element method

Autoři

ŠTRBKOVÁ, L.

Vydáno

25.04.2013

Nakladatel

LITERA

Místo

Brno

ISBN

978-80-214-4694-6

Kniha

Proceedings of the 19th Conference STUDENT EEICT 2013 Volume 2

Strany od

120

Strany do

122

Strany počet

3

URL

http://www.feec.vutbr.cz/EEICT/2013/sbornik/02magisterskeprojekty/05teoretickaelektrotechnikafyzikaamatematika/05-115119.pdf

BibTex

@inproceedings{BUT114405,
  author="Lenka {Štrbková}",
  title="Methodics of characterisation for the cold field-emission sources intended for electron microscopy",
  booktitle="Proceedings of the 19th Conference STUDENT EEICT 2013 Volume 2",
  year="2013",
  number="1",
  pages="120--122",
  publisher="LITERA",
  address="Brno",
  isbn="978-80-214-4694-6",
  url="http://www.feec.vutbr.cz/EEICT/2013/sbornik/02magisterskeprojekty/05teoretickaelektrotechnikafyzikaamatematika/05-115119.pdf"
}