Detail publikačního výsledku

Ultra-short solitary electromagnetic pulses measurement and semiconductor testing

FIALA, P., GESCHEIDTOVÁ, E., DREXLER, P.

Originální název

Ultra-short solitary electromagnetic pulses measurement and semiconductor testing

Anglický název

Ultra-short solitary electromagnetic pulses measurement and semiconductor testing

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

In connection with the events of the last few years and with the increased number of terrorist activities, the problem of identification and measurement of electromagnetic weapons or other systems impact occurred. Among these are also microwave sources, which can reach extensive peak power of up to Pmax = 100 MW. Solitary, in some cases several times repeated, impulses lasting from tp Î <1, 60> ns, cause the destruction of semiconductor junctions. These days we can find scarcely no human activity, where semiconductor structures are not used. The problem of security support of the air traffic, transportation, computer nets, banks, national strategic data centers, and other applications crops up. Several types of system protection from the ultra-short electromagnetic pulses present itself, passive and active protection. The analysis of the possible measuring methods, convenient for the identification and measurement of the ultra-short solitary electromagnetic pulses is presented in this paper; some of the methods were chosen and used for practical measurement.

Anglický abstrakt

In connection with the events of the last few years and with the increased number of terrorist activities, the problem of identification and measurement of electromagnetic weapons or other systems impact occurred. Among these are also microwave sources, which can reach extensive peak power of up to Pmax = 100 MW. Solitary, in some cases several times repeated, impulses lasting from tp Î <1, 60> ns, cause the destruction of semiconductor junctions. These days we can find scarcely no human activity, where semiconductor structures are not used. The problem of security support of the air traffic, transportation, computer nets, banks, national strategic data centers, and other applications crops up. Several types of system protection from the ultra-short electromagnetic pulses present itself, passive and active protection. The analysis of the possible measuring methods, convenient for the identification and measurement of the ultra-short solitary electromagnetic pulses is presented in this paper; some of the methods were chosen and used for practical measurement.

Klíčová slova

Ultra-short electromagnetic puls, high power microwave generator, calorimetric method, magneto-optical effect, multilayer sensor, Vircator, semiconductors.

Klíčová slova v angličtině

Ultra-short electromagnetic puls, high power microwave generator, calorimetric method, magneto-optical effect, multilayer sensor, Vircator, semiconductors.

Autoři

FIALA, P., GESCHEIDTOVÁ, E., DREXLER, P.

Vydáno

14.09.2004

Nakladatel

VOP 026 Štenberk, s.p.

Místo

Vyškov

Kniha

Výkonová elektromagnetická pole v paxi a návaznost na EMC

Svazek

1

Číslo

1

Strany od

1

Strany počet

80

BibTex

@inproceedings{BUT11439,
  author="Pavel {Fiala} and Eva {Gescheidtová} and Petr {Drexler}",
  title="Ultra-short solitary electromagnetic pulses measurement and semiconductor testing",
  booktitle="Výkonová elektromagnetická pole v paxi a návaznost na EMC",
  year="2004",
  volume="1",
  number="1",
  pages="80",
  publisher="VOP 026 Štenberk, s.p.",
  address="Vyškov"
}