Detail publikačního výsledku

Experience with Pressure Rise Calculation in Medium Voltage Switchgear

BAJÁNEK, T.; KALINA, E.; PERNICA, R.; TŮMA, D.

Originální název

Experience with Pressure Rise Calculation in Medium Voltage Switchgear

Anglický název

Experience with Pressure Rise Calculation in Medium Voltage Switchgear

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This paper focuses on the application of simplified model for the calculation of the pressure rise in medium voltage switchgear due to internal arc fault. It describes how it can be used for development of the metal switchgear enclosure, for comparison of various types of gas ducts and evaluation of pressure rise in switchroom during internal arc fault.

Anglický abstrakt

This paper focuses on the application of simplified model for the calculation of the pressure rise in medium voltage switchgear due to internal arc fault. It describes how it can be used for development of the metal switchgear enclosure, for comparison of various types of gas ducts and evaluation of pressure rise in switchroom during internal arc fault.

Klíčová slova

pressure rise; internal arc; switchgear; calculation; model; simulation

Klíčová slova v angličtině

pressure rise; internal arc; switchgear; calculation; model; simulation

Autoři

BAJÁNEK, T.; KALINA, E.; PERNICA, R.; TŮMA, D.

Rok RIV

2016

Vydáno

20.05.2015

ISBN

978-1-4673-6787-5

Kniha

Proceedings of 2015 16th International Scientific Conference on Electric Power Engineering.

Strany od

359

Strany do

363

Strany počet

5

URL

https://ieeexplore.ieee.org/document/7161117

BibTex

@inproceedings{BUT114206,
  author="BAJÁNEK, T. and KALINA, E. and PERNICA, R. and TŮMA, D.",
  title="Experience with Pressure Rise Calculation in Medium Voltage Switchgear",
  booktitle="Proceedings of 2015 16th International Scientific Conference on Electric Power Engineering.",
  year="2015",
  pages="359--363",
  doi="10.1109/EPE.2015.7161117",
  isbn="978-1-4673-6787-5",
  url="https://ieeexplore.ieee.org/document/7161117"
}