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KLAPETEK, P.; VALTR, M.; MARTINEK, J.
Originální název
Large area high-speed metrology SPM system Large area high-speed metrology SPM system Large area high-speed metrology SPM system
Anglický název
Druh
Článek WoS
Originální abstrakt
We present a large area high-speed measuring system capable of rapidly generating nanometre resolution scanning probe microscopy data over mm2 regions. The system combines a slow moving but accurate large area XYZ scanner with a very fast but less accurate small area XY scanner. This arrangement enables very large areas to be scanned by stitching together the small, rapidly acquired, images from the fast XY scanner while simultaneously moving the slow XYZ scanner across the region of interest. In order to successfully merge the image sequences together two software approaches for calibrating the data from the fast scanner are described.
Anglický abstrakt
Klíčová slova
scanning probe microscopy, high-speed SPM, metrology
Klíčová slova v angličtině
Autoři
Rok RIV
2016
Vydáno
20.01.2015
ISSN
0957-4484
Periodikum
NANOTECHNOLOGY
Svazek
26
Číslo
6
Stát
Spojené království Velké Británie a Severního Irska
Strany od
1
Strany do
10
Strany počet
BibTex
@article{BUT112268, author="Petr {Klapetek} and Miroslav {Valtr} and Jan {Martinek}", title="Large area high-speed metrology SPM system Large area high-speed metrology SPM system Large area high-speed metrology SPM system", journal="NANOTECHNOLOGY", year="2015", volume="26", number="6", pages="1--10", doi="10.1088/0957-4484/26/6/065501", issn="0957-4484" }