Detail publikace

Artifact removal by local extrema detection in images from electron microscopy

KASPAR, P.

Originální název

Artifact removal by local extrema detection in images from electron microscopy

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Processing of images from electron microscopy is important for a succesful analysis of acquired output. As with the majority of digital signals, these are plagued by various types of noise or artifacts. This paper concerns the detection and removal of artifacts created by sample contamination and the following reverse edge detection for displaying image segmentation.

Klíčová slova

LEEM, artifact detection, artifact removal, edge detection

Autoři

KASPAR, P.

Rok RIV

2014

Vydáno

24. 4. 2014

Nakladatel

LITERA

Místo

Tábor 43a, 612 00, Brno

ISBN

978-80-214-4922-0

Kniha

STUDENT EEICT, Proceedings of the 20th conference, Volume 3

Číslo edice

1

Strany od

31

Strany do

35

Strany počet

5

BibTex

@inproceedings{BUT108866,
  author="Pavel {Kaspar}",
  title="Artifact removal by local extrema detection in images from electron microscopy",
  booktitle="STUDENT EEICT, Proceedings of the 20th conference, Volume 3",
  year="2014",
  number="1",
  pages="31--35",
  publisher="LITERA",
  address="Tábor 43a, 612 00, Brno",
  isbn="978-80-214-4922-0"
}