Detail publikace

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

VANĚK, J., CHOBOLA, Z., BAŘINKA, R.

Originální název

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Český název

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

cs

Originální abstrakt

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Český abstrakt

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Rok RIV

2002

Vydáno

01.01.2002

Nakladatel

Czech Technical University in Praque

Místo

Herbertov

ISBN

80-01-02579-9

Kniha

Proceedings of International Workshop Physical and Maaterial Engineering 2002

Strany od

121

Strany do

122

Strany počet

2

Dokumenty

BibTex 


@inproceedings{BUT10405,
  author="Jiří {Vaněk} and Zdeněk {Chobola} and Radim {Bařinka}",
  title="Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools",
  annote="Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools",
  address="Czech Technical University in Praque",
  booktitle="Proceedings of International Workshop Physical and Maaterial Engineering 2002",
  chapter="10405",
  institution="Czech Technical University in Praque",
  year="2002",
  month="january",
  pages="121",
  publisher="Czech Technical University in Praque",
  type="conference paper"
}