Detail publikačního výsledku

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

ZACHARIÁŠOVÁ, M.; BOLCHINI, C.; KOTÁSEK, Z.

Originální název

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Anglický název

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Druh

Stať ve sborníku mimo WoS a Scopus

Originální abstrakt

In this paper we performed a detailed analysis of two approaches devoted to generation of input test vectors with respect to detection of stuck-at faults: the rst one is Automatic Test Pattern Generation, the second one is Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced ideas about their combination in order
to create a new promising approach for testing reliable systems.

Anglický abstrakt

In this paper we performed a detailed analysis of two approaches devoted to generation of input test vectors with respect to detection of stuck-at faults: the rst one is Automatic Test Pattern Generation, the second one is Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced ideas about their combination in order
to create a new promising approach for testing reliable systems.

Klíčová slova

ATPG, functional verification.

Klíčová slova v angličtině

ATPG, functional verification.

Autoři

ZACHARIÁŠOVÁ, M.; BOLCHINI, C.; KOTÁSEK, Z.

Rok RIV

2014

Vydáno

21.06.2013

Nakladatel

COST, European Cooperation in Science and Technology

Místo

Avignon

ISBN

978-2-11-129175-1

Kniha

Proceedings of The Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale

Strany od

35

Strany do

38

Strany počet

4

BibTex

@inproceedings{BUT103529,
  author="Marcela {Zachariášová} and Cristiana {Bolchini} and Zdeněk {Kotásek}",
  title="Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability",
  booktitle="Proceedings of The Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale",
  year="2013",
  pages="35--38",
  publisher="COST, European Cooperation in Science and Technology",
  address="Avignon",
  isbn="978-2-11-129175-1"
}