Detail publikace
Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells
VANĚK, J. DOLENSKÝ, J. CHOBOLA, Z. LUŇÁK, M. PORUBA, A.
Originální název
Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells
Anglický název
Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells
Jazyk
en
Originální abstrakt
This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric field is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.
Anglický abstrakt
This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric field is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.
Dokumenty
BibTex
@article{BUT96296,
author="Jiří {Vaněk} and Jan {Dolenský} and Zdeněk {Chobola} and Miroslav {Luňák} and Ales {Poruba}",
title="Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells",
annote="This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric field is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.",
address="ECS",
chapter="96296",
institution="ECS",
number="1",
volume="40",
year="2012",
month="may",
pages="177--185",
publisher="ECS",
type="journal article - other"
}