Detail publikačního výsledku

Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells

VANĚK, J.; DOLENSKÝ, J.; CHOBOLA, Z.; LUŇÁK, M.; PORUBA, A.

Originální název

Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells

Anglický název

Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells

Druh

Článek recenzovaný mimo WoS a Scopus

Originální abstrakt

This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric field is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.

Anglický abstrakt

This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric field is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.

Klíčová slova

microplasma, noise, solar cell

Klíčová slova v angličtině

microplasma, noise, solar cell

Autoři

VANĚK, J.; DOLENSKÝ, J.; CHOBOLA, Z.; LUŇÁK, M.; PORUBA, A.

Rok RIV

2013

Vydáno

14.05.2012

Nakladatel

ECS

ISSN

1938-5862

Periodikum

ECS Transactions

Svazek

40

Číslo

1

Stát

Spojené státy americké

Strany od

177

Strany do

185

Strany počet

9

BibTex

@article{BUT96296,
  author="Jiří {Vaněk} and Jan {Dolenský} and Zdeněk {Chobola} and Miroslav {Luňák} and Ales {Poruba}",
  title="Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells",
  journal="ECS Transactions",
  year="2012",
  volume="40",
  number="1",
  pages="177--185",
  issn="1938-5862"
}