Detail publikačního výsledku

Microelectronic structure reliability evaluation using response surface methodology

NOVOTNÝ, R.

Originální název

Microelectronic structure reliability evaluation using response surface methodology

Anglický název

Microelectronic structure reliability evaluation using response surface methodology

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.

Anglický abstrakt

The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.

Klíčová slova v angličtině

reliability assessment, electronic devices, empirical approach

Autoři

NOVOTNÝ, R.

Vydáno

01.01.2003

Nakladatel

Zdeněk Novotný

Místo

Brno

ISBN

8021424524

Kniha

10th Electronic Devices and Systems Conference 2003

Strany od

166

Strany počet

4

BibTex

@inproceedings{BUT8375,
  author="Radovan {Novotný}",
  title="Microelectronic structure reliability evaluation using response surface methodology",
  booktitle="10th Electronic Devices and Systems Conference 2003",
  year="2003",
  pages="4",
  publisher="Zdeněk Novotný",
  address="Brno",
  isbn="8021424524"
}