Detail publikačního výsledku

Noncontact Scanning Force Microscopy - Principles and Simulations

KALOUSEK, R., ŠIKOLA, T., BUŠ, V., ŠKODA, D.

Originální název

Noncontact Scanning Force Microscopy - Principles and Simulations

Anglický název

Noncontact Scanning Force Microscopy - Principles and Simulations

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.

Anglický abstrakt

In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.

Klíčová slova v angličtině

noncontact SFM, nanostructures, interatomic forces

Autoři

KALOUSEK, R., ŠIKOLA, T., BUŠ, V., ŠKODA, D.

Vydáno

15.11.2001

Nakladatel

FEI VUT v Brně

Místo

Brno

ISBN

80-214-1992-X

Kniha

Sborník příspěvků konference Nové trendy ve fyzice

Strany od

369

Strany počet

6

BibTex

@inproceedings{BUT6498,
  author="Radek {Kalousek} and Tomáš {Šikola} and Vladan {Buš} and David {Škoda}",
  title="Noncontact Scanning Force Microscopy - Principles and Simulations",
  booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
  year="2001",
  pages="6",
  publisher="FEI VUT v Brně",
  address="Brno",
  isbn="80-214-1992-X"
}