Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikačního výsledku
HOFEREK, L.; TRIVEDI, R.; MISTRÍK, J.; ČECH, V.
Originální název
Anisotropic film construction using plasma nanotechnology (atomic polymerization)
Anglický název
Druh
Abstrakt
Originální abstrakt
Bilayers consisting of a-SiC:H and a-SiOC:H alloys were deposited on silicon wafer using plasma-enhanced chemical vapor deposition (PECVD). The layered structures were subjected to ellipsometric measurements that enabled us to distinguish individual layers and determine the layer thickness and its optical constants. In next study, single layer and multilayered a-SiC:H films, deposited from tetravinylsilane at different powers by PECVD, were investigated intensively by spectroscopic ellipsometry, nanoindentation, and atomic force microscopy (AFM) to compare optical and mechanical properties of the individual layer of decreased thickness (315 - 25 nm) with those of the corresponding single layer.
Anglický abstrakt
Klíčová slova
plasma polymerization, thin films
Klíčová slova v angličtině
Autoři
Rok RIV
2011
Vydáno
27.12.2010
Kniha
IC-Plants 2010
Strany od
1
Strany do
2
Strany počet
BibTex
@misc{BUT60975, author="Lukáš {Hoferek} and Rutul Rajendra {Trivedi} and Jan {Mistrík} and Vladimír {Čech}", title="Anisotropic film construction using plasma nanotechnology (atomic polymerization)", booktitle="IC-Plants 2010", year="2010", edition="1", pages="1--2", note="Abstract" }