Detail publikačního výsledku

Non-destructive Testing of Luminescent Diodes by Noise

KOKTAVÝ, P., ŠIKULA, J.

Originální název

Non-destructive Testing of Luminescent Diodes by Noise

Anglický název

Non-destructive Testing of Luminescent Diodes by Noise

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Results of microplasma noise studying may be used for p-n junction non-destructive diagnostics and quality assessment.

Anglický abstrakt

Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Results of microplasma noise studying may be used for p-n junction non-destructive diagnostics and quality assessment.

Klíčová slova

Luminiscent Diode, LED, Microplasma, Noise, Reliability

Klíčová slova v angličtině

Luminiscent Diode, LED, Microplasma, Noise, Reliability

Autoři

KOKTAVÝ, P., ŠIKULA, J.

Rok RIV

2011

Vydáno

01.01.2002

Nakladatel

European Federation for Non-Destructive Testing

Místo

Madrid

ISBN

84-699-8573-6

Kniha

8-th ECNDT

Strany od

247

Strany počet

1

BibTex

@inproceedings{BUT5702,
  author="Pavel {Koktavý} and Josef {Šikula}",
  title="Non-destructive Testing of Luminescent Diodes by Noise",
  booktitle="8-th ECNDT",
  year="2002",
  number="1.",
  pages="1",
  publisher="European Federation for Non-Destructive Testing",
  address="Madrid",
  isbn="84-699-8573-6"
}